Abstract:The modern FPGAs have begun to use 6-input look-up tables to perform configurable logic,such as Xilinx's Virtex-5 series,Ultrascale series and so on.Due to the limited number of IOB ports,most approaches choose the ILA based method for the functional test of these chips' CLB module,and use read-back techniques for fault isolation.Unfortunately some of the data-paths are exclusive in CLB;So ILA methods usually cost more configurations,while read-back is quite slow.The Built-In Self-Test(BIST) methods directorially check the output pins of CLBs,which reduce the number of configurations.But BIST methods should transfer test benches signals to ever BUT,which leads to massive fan-out and make it difficult to route the design.This paper presents a new BIST method which use the free resource in ORAs to form latch chains to transfer test benches.This method is able to decrease the fan-out of I/O ports.And the remaining logic resources are configured to form a scan-chain for faster fault isolation.The BIST method is tested on a Xilinx 7 series FPGA chips.Compared with the former works,the number of configurations is reduced from 30 to 26,and the cost of fault isolation is reduced to 61.35 ns with a 2.4 MHz clock.

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

A Novel BIST Approach for Testing Logic Resources Using Hard Macro

A novel BIST approach for testing input/output buffers in FPGAs.

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

BIST-based test and diagnosis of FPGA logic blocks

Study of Test Method Based on BIST for FPGA

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

A novel FPGA manufacture-oriented interconnect fault test

Built-In Self-Test Design For Fault Detection Of Muxfxs In Sram-Based Fpgas

Improved Method for Combinational Circuit's Built-In Self Test

An All-Digital Built-In Self-Test for Charge-Pump Phase-Locked Loops

On the Design of Built-in Self-Test Circuits in FCT6

Built-In Self-Test scheme for all-digital Phase-Locked loops

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A register-transfer level BIST partitioning approach for ASIC designs

A Implementation For Built-In Self-Testing Of Rapidio By Jtag

An Improvement Test Approach of Look-up Table in SRAM-Based FPGAs

Built-in Self-Test Structure for Fault Detection of Charge-Pump Phase-Locked Loop

Bist Approach for Testing Embedded Memory Blocks in System-On-Chips