Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

A Universal Automatic On-Chip Measurement Of Fpga'S Internal Setup And Hold Times

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

Design for HW/SW Co-Testing Based on FPGA

Chip Tester Based on FPGA Commonly Used in Laboratory

On-chip Clock Jitter Testing Circuit Based on Pulse-Shrinkage and Accumulation Register

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality

Design And Implementation Of The Configuration Circuit For Fdp Fpga

A novel BIST approach for testing input/output buffers in FPGAs.

Placement With Time Constraints For Fpga Design

A 3.8 ps RMS time synchronization implemented in a 20 nm FPGA

On-Chip Real-Time Correction for a 20-Ps Wave Union Time-To-Digital Converter (TDC) in a Field-Programmable Gate Array (FPGA)

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

A High-Precision 2.5-Ps RMS Time Synchronization for Multiple High-Speed Transceivers in FPGA

A High-Throughput Vernier Time-to-Digital Converter on FPGAs with Improved Resolution Using a Bi-Time Interpolation Scheme

A Compact Pico-Second In-Situ Sensor Using Programmable Ring Oscillators For Advanced On Chip Variation Characterization In 28nm Hkmg

New High-Rate Timestamp Management with Real-Time Configurable Virtual Delay and Dead Time for FPGA-Based Time-to-Digital Converters

A novel FPGA manufacture-oriented interconnect fault test

On-Chip Structures for Fmax Binning and Optimization