Abstract:Time-to-digital converters (TDCs) act as a core component in many timing-critical systems. Tapped delay line is the most widely used style for the field-programmable gate-array (FPGA)-based TDCs, but it suffers from several intractable problems such as poor nonlinearity and long delay-line occupation. Recently, a new ring-oscillator-based Vernier TDC circuit using carry chains was demonstrated to have much smaller nonlinearity with a much shorter delay line. Since the used delay line is not compensated, the timing jitter increases (or the precision degrades) remarkably when the oscillation number is large. This would incur undesirable lower resolution selection to maintain acceptable precision. In this article, a novel bidirectional-operating Vernier delay line structure is proposed to reduce the required oscillation number during the fine time measurement. Traditionally, for the Vernier delay line, the fast signal propagates along the slow delay line, while the slow signal propagates along the fast delay line, to which we call the normal Vernier delay line. The new structure proposes two parallelized Vernier delay line, consisting of one normal Vernier delay line and another abnormal Vernier delay line. The term "abnormal" refers to that the fast and slow signals are unusually fed to the fast and slow delay lines, respectively. A prototype TDC circuit based on this new method was implemented on a Stratix III FPGA. Test results demonstrate that by adopting the proposed novel circuit architecture, both the resolution and the root-mean-square error can be improved from the 30–40-ps level to the 20–30-ps level.

A High-Throughput Vernier Time-to-Digital Converter on FPGAs with Improved Resolution Using a Bi-Time Interpolation Scheme

A High-Linearity Vernier Time-to-Digital Converter on FPGAs With Improved Resolution Using Bidirectional-Operating Vernier Delay Lines

High-Resolution Time-to-Digital Converters Implemented on 40-, 28-, and 20-Nm FPGAs

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

A Two-Stage Interpolation Time-to-Digital Converter Implemented in 20 and 28 N·m FGPAs

A High-Resolution TDC Design Based on Multistep Fine Time Measurement by Utilizing Delay-Adjustable Looped Carry Chains on FPGAs

A High-Resolution Tdc Implemented In A 90nm Process Fpga

A High Resolution Time-to-digital-convertor Based on a Carry-Chain and DSP48E1 Adders in a 28-Nm Field-Programmable-gate-array

Two-Stage Clock-Free Time-to-Digital Converter Based on Vernier and Tapped Delay Lines in FPGA Device

FPGA Vernier Digital-to-Time Converter With 1.58 ps Resolution and 59.3 Minutes Operation Range

A 3.9-ps RMS Precision Time-to-Digital Converter Using Ones-Counter Encoding Scheme in a Kintex-7 FPGA

Low-cost FPGA-based multi-channel TDC with high resolution and density for time-of-flight detectors

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A 1.15-Ps Bin Size and 3.5-Ps Single-Shot Precision Time-to-Digital Converter with On-Board Offset Correction in an FPGA

Design of a high-precision time-to-digital converter in an Elitestek Ti60 field-programmable-gate-array

A high resolution multi-phase clock Time-Digital Convertor implemented on Kintex-7 FPGA

A Vernier Time-to-Digital Converter with 1.5ps Resolution for an All-Digital Phase Locked Loop in 28nm CMOS.

A Simple Smart Time-to-digital Convertor Based on Vernier Method for a High Resolution LYSO MicroPET

A 19 ps Precision and 170 M Samples/s Time-to-Digital Converter Implemented in FPGA with Online Calibration

A 50-Ps Gated VCRO-Based TDC with Compact Phase Interpolators for Flash LiDAR