Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

A novel BIST approach for testing input/output buffers in FPGAs.

A Novel BIST Approach for Testing Input/Output Buffers in SOCs

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

A Novel BIST Approach for Testing Logic Resources Using Hard Macro

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

An Effective BIST Circuit for Barrel Shifter Within 8 Bits MCU

Bist Approach for Testing Embedded Memory Blocks in System-On-Chips

A novel FPGA manufacture-oriented interconnect fault test

BIST-based test and diagnosis of FPGA logic blocks

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Hybrid BIST for system-on-a-chip using an embedded FPGA core

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

BIST Methodology, Architecture and Circuits for Pre-Bond TSV Testing in 3D Stacking IC Systems

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

A Universal Automatic On-Chip Measurement Of Fpga'S Internal Setup And Hold Times

Design for HW/SW Co-Testing Based on FPGA

Scan BIST with Biased Scan Test Signals

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas