Abstract:SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages.However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit's Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space applications where reliability is vital.We proposed a SEU-fault emulation platform to evaluate circuit's SEU mitigation performance.The platform does not need any external circuit or micro controller to manage fault emulation process compared with existing approach.Source codes of Circuit Under Test (CUT) do not need to be modified or intruded with any component.It is a non-intrusive testing.Communication between host-computer and emulation board is minimized to accelerate fault injection speed.Experimental result shows that a single fault injecting (including Multi-Bits-Upset) only costs 29us.A circuit state reloading technology is exploited to increase emulation efficiency.Moreover, in the field of evolvable hardware, genetic operations can be reconfigured and its fitness can be evaluated on-line using the proposed fast dynamic reconfiguration method, which is useful for implementing self-repair and self-evolutionary hardware.

Fault Detection for FPGA's Logic Resources on Test System

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

Multiple Faults Detection with SoC Dynamic Reconfiguration System Based on FPGA

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

BIST-based test and diagnosis of FPGA logic blocks

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

Built-In Self-Test Design For Fault Detection Of Muxfxs In Sram-Based Fpgas

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

A Novel BIST Approach for Testing Logic Resources Using Hard Macro

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Method and system for testing on site programmable gate array

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

Research on Fault Mask in the Test of FPGA

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

An Accurate Fault Location Method Based on Configuration Bitstream Analysis

The Research of Test Method of FPGA Circuit Board based on Functional Modeling

Auto-Generation of Universal Test Pattern for FPGA Logic Resources

Fault-Tolerance Design of Xilinx FPGA with Self-Hosting Configuration Management