Abstract:It is known that the complexity of automatic test pattern generation (ATPG) for acyclic sequential circuits is similar to that of combinational ATPG. The general problem, however, requires time-frame expansion and multiple-fault detection and hence does not allow the use of available combinational ATPG programs. The first contribution of this work is a combinational single-fault ATPG method for the most general class of acyclic sequential circuits. Without inserting any real hardware, we create a functionally equivalent “balanced” ATPG model of the circuit in which all reconverging paths have the same sequential depth. Some primary inputs and gates are duplicated in this model, which is converted into a combinational circuit by shorting all flip-flops. A test vector obtained by a combinational ATPG program for a fault in this combinational circuit is transformed into a test sequence to detect a corresponding fault in the original sequential circuit. A combinational ATPG program finds tests for all but a small set of faults that must be explicitly detected as multiple-faults. Those are modeled for ATPG using the second contribution of this work, which is a generalized method to model any given multiple stuck-at fault as a single stuck-at fault. The procedure requires insertion of at most $n+3$ modeling gates for a fault of multiplicity $n$. We show that the modeled circuit is functionally equivalent to the original circuit and the targeted multiple fault is equivalent to the modeled single stuck-at fault. Benchmark results show at least an order of magnitude saving in the ATPG CPU time by the new combinational method over sequential ATPG.

A Programmable Fault Testing Equipment for Combinational Networks

Multiple Fault Detection for Combinational Logic Circuits

Fault Detection for FPGA's Logic Resources on Test System

Test generation for cyclic combinational circuits

Combinational automatic test pattern generation for acyclic sequential circuits

Redundant Logic Insertion and Fault Tolerance Improvement in Combinational Circuits

On Full Path Delay Fault Testability of Combinational Circuits

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

Method and system for testing on site programmable gate array

A Novel Scheme for Application-Dependent Testing of FPGAs

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

Generating Compact Robust and Non-Robust Tests for Complete Coverage of Path Delay Faults Based on Stuck-at Tests.

Fault Tolerant Synthesis of Reversible Circuits

A Combinatorial Testing-Based Approach to Fault Localization

Sequential circuit ATPG using combinational algorithms

Circuit-Level Modeling for Concurrent Testing of Operational Defects due to Gate Oxide Breakdown

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

An Algorithm for Fault Diagnosis Based on Combinatorial Design Approach for Testing

A Versatile Test Set Generation Tool for Structural Analog Circuit Testing

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

Fast And Effective Fault Simulation For Path Delay Faults Based On Selected Testable Paths