Abstract:The invention relates to a testing method for a field programmable gate array (FPGA). The method comprises the following steps: obtaining an initial design netlist and an initial design configuration of the FPGA; replacing a look-up table function of the initial design netlist and the initial design configuration with an exclusive or function of a logic function to obtain an initial testing netlist and an initial testing configuration; selecting an observation node of the initial testing netlist based on a preset rule of a testability analysis method, and obtaining a testing netlist and a corresponding testing vector; configuring an output terminal of an output and input unit from the observation node to the initial testing configuration to obtain a testing configuration; connecting the testing configuration to an configuration device according to an excitation signal of the configuration device to obtain an output logic value of the testing vector; and analyzing the output logic value and a response value of the testing vector to obtain the testing result. The method can effectively detect permanent faults of interconnection lines used in the application design of FPGA chips.

Method and system for testing on site programmable gate array

Design and implementation of a PCB testing system

A Novel Scheme for Application-Dependent Testing of FPGAs

Design for HW/SW Co-Testing Based on FPGA

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Design and Implementation of the Testing Method for FPGA Chip Development

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

Fault Detection for FPGA's Logic Resources on Test System

A novel layout automation flow to facilitate test chip design for standard cell characterization

A novel FPGA manufacture-oriented interconnect fault test

FPGA based low-cost Portable Tester with On-Board Supplies

Chip Tester Based on FPGA Commonly Used in Laboratory

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

A Novel Automated FPGA Interconnect Test Algorithm

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

An improved method for test chip design

A design-for-test for SRAM-based FPGA interconnect testing