Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

A Novel Scheme for Application-Dependent Testing of FPGAs

A Novel Automated FPGA Interconnect Test Algorithm

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A design-for-test for SRAM-based FPGA interconnect testing

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Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

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A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

A novel layout automation flow to facilitate test chip design for standard cell characterization

FPGA Interconnect Test Algorithm Based on Routing Resource Graph

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix