Abstract:Due to its dominance in FPGA area and delay, the interconnect circuit is traditionally designed and optimized in full customized fashion, which can be extremely time consuming. In this paper, we propose an automated transistor-level sizing optimization method for the widely-used General Routing Matrix FPGA interconnect circuits with the following three features: (1) an area model that takes into account the commonly used diffusion sharing, transistor folding and inputs sharing techniques in order to have an accurate area predication; (2) an accurate and effective non-linear delay model that treats the wire within a circuit and the wire between interconnect circuits separately; (3) a multi-thread acceleration method and the Minimum-Final-Delay algorithm to speed-up the simulation. The global optimization cost is measured by the product of the interconnect circuit area and the representative path delay based on our proposed models. The cost reduces 10.9%, when we use 65nm CMOS process chip for evaluation. The simulation time for different transistor sizing combinations is improved by 9X and 15X when 10 and 50 threads are used, respectively, faster than single-thread. Compared with the manual design method, our proposed optimization approach explores a larger design space and reduces the optimization time from months to hours.

A Novel Automated FPGA Interconnect Test Algorithm

FPGA Interconnect Test Algorithm Based on Routing Resource Graph

A design-for-test for SRAM-based FPGA interconnect testing

A novel FPGA manufacture-oriented interconnect fault test

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

Application Dependent FPGA Interconnect Test Method with Small Test Configuration Number Using SMT Net-Grouping Constraints

A Novel Scheme for Application-Dependent Testing of FPGAs

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

Application-Dependent Interconnect Testing Of Xilinx Fpgas Based On Line Branches Partitioning

Design for HW/SW Co-Testing Based on FPGA

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Method and system for testing on site programmable gate array

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

An Automatic Transistor-Level Tool for GRM FPGA Interconnect Circuits Optimization

Research on Fault Mask in the Test of FPGA