Abstract:SRAM-Filed Programmable Gate Arrays (FPGA) have become one of the most important carriers of digital electronic system because of its many inborn advantages.However, as manufacture of Integrated Circuit evolves towards Very Deep Sub-Micron technology, FPGA designers must be careful of circuit's Single Event Upset (SEU) susceptibility when used in hostile environment, such as avionics and space applications where reliability is vital.We proposed a SEU-fault emulation platform to evaluate circuit's SEU mitigation performance.The platform does not need any external circuit or micro controller to manage fault emulation process compared with existing approach.Source codes of Circuit Under Test (CUT) do not need to be modified or intruded with any component.It is a non-intrusive testing.Communication between host-computer and emulation board is minimized to accelerate fault injection speed.Experimental result shows that a single fault injecting (including Multi-Bits-Upset) only costs 29us.A circuit state reloading technology is exploited to increase emulation efficiency.Moreover, in the field of evolvable hardware, genetic operations can be reconfigured and its fitness can be evaluated on-line using the proposed fast dynamic reconfiguration method, which is useful for implementing self-repair and self-evolutionary hardware.

Research on Fault Mask in the Test of FPGA

The Research of Test Method of FPGA Circuit Board based on Functional Modeling

The Research of FPGA Reliability Based on Redundancy Methods

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

An FPGA Robust Technology Mapping Method

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

Fault Detection for FPGA's Logic Resources on Test System

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Automated FPGA Interconnect Test Algorithm

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Fault modeling and characteristics of SRAM-based FPGAs (abstract only).

Design for HW/SW Co-Testing Based on FPGA

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

Research on SAT Solver-Based PFGA Permanent Failure Fault Tolerant Technique

Hidden Faults, Masking Failure Faults And Multiple Faults Diagnosis

Fuzzy fault tree analysis of mask stage

FPGA Testing Points Optimization Method for Aerospace Vehicle

A Test Pattern Generation Method Based on Fault Injection for Logic Elements of FPGA

A novel FPGA manufacture-oriented interconnect fault test