A High-Efficient and Accurate Fault Model Aiming at FPGA-based AES Cryptographic Applications

Nan Liao,Xiaoxin Cui,Tian Wang,Kai Liao,Yewen Ni,Dunshan Yu,Xiaole Cui
DOI: https://doi.org/10.1109/asicon.2015.7517030
2015-01-01
Abstract:Setup time variation fault attacks that aim straightly at the FPGA devices have become hot spots nowadays. A high-efficient and accurate fault model aiming at FPGA-based cryptographic applications is proposed in this paper. Multi-diagonal faults are considered in this paper, thus more exploitable faulty ciphertexts can be gathered compared with the previous model. Multi-fault analysis is introduced due to the existence of multi-fault injection, which guarantees the accuracy of the result. Experiment result shows that the fault model brings a significant increase up to 36.5% of the exploitable faults compared with the previous method. Within 24 pairs of correct and faulty ciphertexts, the complete round key can be retrieved by this model.
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