Abstract:The significance of FPGA test and the challenge of its increasing cost can never be ignored. In island-style FPGA architectures, hex lines are the principal interconnect resources. Testing hex lines and hex Programmable Interconnect Points (PIPs) have remained as the major technical difficulty in FPGAs test due to complex interconnect rules. Particularly, test in oblique direction of hex PIPs has rarely been addressed in previous studies. Towards this challenge, this paper for the first time proposes a coordinate system and formulates the interconnect rules of hex lines as mathematical equations. For hex PIPs in horizontal and vertical direction, an efficient circle test structure is formed by coordinate equations. For hex PIPs in oblique direction, the coordinate method is used to generate the partial-cascade pattern. The corresponding test vector is also generated, which ensures the ergodicity of hex PIPs in oblique direction. In addition to hex PIPs, hex lines are also covered without extra effort. Compared to previous researches, the configuration number for hex lines is decreased significantly. We evaluate this method on Xilinx XC2V1000, and experimental results show that our proposed method achieves 100% fault coverage for hex PIPs and can be generally applied to all mainstream island-style FPGAs with a similar interconnect structure currently.

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

A novel FPGA manufacture-oriented interconnect fault test

A Novel Automated FPGA Interconnect Test Algorithm

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

A design-for-test for SRAM-based FPGA interconnect testing

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

Tree-Based Intermittent Connection Fault Diagnosis for Controller Area Network

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

A Cost-Efficient Self-Configurable BIST Technique for Testing Multiplexer-Based FPGA Interconnect

FPGA Interconnect Test Algorithm Based on Routing Resource Graph

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

Application-Dependent Interconnect Testing Of Xilinx Fpgas Based On Line Branches Partitioning

Application Dependent FPGA Interconnect Test Method with Small Test Configuration Number Using SMT Net-Grouping Constraints

A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).

The Research of Test Method of FPGA Circuit Board based on Functional Modeling

Coordinating routing resources for hex pips test in island-style FPGAs (abstract only).

Method and system for testing on site programmable gate array

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System