A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).

Xianjian Zheng,Fan Zhang,Lei Chen,Zhiping Wen,Yuanfu Zhao,Xuewu Li
DOI: https://doi.org/10.1145/2684746.2689123
2015-01-01
Abstract:The programmability of an FPGA poses a number of challenges when it comes to complete and comprehensive testing of the FPGA itself. A large number of configurations must be downloaded into the FPGA to test the programmable sources. A great many methods were proposed to reduce the number of configurations to minimize the test time, but few of papers were focus on reducing single configuration time. This paper proposes a novel method to reduce more than 30% of the total configuration time based on partial reconfiguration technology and sorting algorithm. This method is implemented on a series of SRAM-based FPGAs. The experimental result shows that this method reduces 30%-45% of the total configuration time and can be generally applied to all SRAM-based FPGAs currently.
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