Abstract:The modern FPGAs have begun to use 6-input look-up tables to perform configurable logic,such as Xilinx's Virtex-5 series,Ultrascale series and so on.Due to the limited number of IOB ports,most approaches choose the ILA based method for the functional test of these chips' CLB module,and use read-back techniques for fault isolation.Unfortunately some of the data-paths are exclusive in CLB;So ILA methods usually cost more configurations,while read-back is quite slow.The Built-In Self-Test(BIST) methods directorially check the output pins of CLBs,which reduce the number of configurations.But BIST methods should transfer test benches signals to ever BUT,which leads to massive fan-out and make it difficult to route the design.This paper presents a new BIST method which use the free resource in ORAs to form latch chains to transfer test benches.This method is able to decrease the fan-out of I/O ports.And the remaining logic resources are configured to form a scan-chain for faster fault isolation.The BIST method is tested on a Xilinx 7 series FPGA chips.Compared with the former works,the number of configurations is reduced from 30 to 26,and the cost of fault isolation is reduced to 61.35 ns with a 2.4 MHz clock.

Application-Dependent Interconnect Testing Of Xilinx Fpgas Based On Line Branches Partitioning

A Novel Scheme for Application-Dependent Testing of FPGAs

Application Dependent FPGA Interconnect Test Method with Small Test Configuration Number Using SMT Net-Grouping Constraints

A Novel FPGA Local Interconnect Test Scheme and Automatic TC Derivation/generation

Testing FPGA Local Interconnects Based on Repeatable Configuration Modules (abstract Only)

Research on an Intelligent Test Method for Interconnect Resources in an FPGA

A New Automatic Method for Testing Interconnect Resources in Fpgas Based on General Routing Matrix

A novel FPGA manufacture-oriented interconnect fault test

A Full Coverage Test Method for Configurable Logic Blocks in Fpga

A New Configuration Scheme for Delay Test in Non-Simple LUT FPGA Designs

A Novel Full Coverage Test Method for CLBs in FPGA (abstract Only).

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

FPGA Interconnect Test and Diagnosis Based on Partial Reconfiguration

Testing and Diagnosis for Both Interconnect Resources and CLBs in Virtex Series FPGAs

A Novel Automated FPGA Interconnect Test Algorithm

Interconnect Resources Multiple Faults Testing and Diagnosis in Field Programmable Gate Arrays

High Performance Programmable Interconnect Resource Design Investigation

A novel layout automation flow to facilitate test chip design for standard cell characterization

A design-for-test for SRAM-based FPGA interconnect testing

A New Built-In Self-Test Method for Functional Test of Configurable Logic Blocks in Modern FPGAs

A Cost-Effective Pre-Bond Functional Test Architecture for 3d Socs