An FPGA Robust Technology Mapping Method

Zhi-hui CHEN,Chun ZHANG,Ying WANG,Ling-li WANG
2011-01-01
Tien Tzu Hsueh Pao/Acta Electronica Sinica
Abstract:A novel radiation-hard FPGA technology mapping method based on partial TMR and logic gate masking and a fast parallel fault injection and Monte Carlo simulation platform are presented. This platform and method have been used in the mapping module which is part of the CAD flow for self-developed FPGA by Fudan University named FDP4. The experimental results show that FDRMap can decrease the circuit fault criticality by 32.62% with the 14.06% area penalty. Comparing to the partial TMR, it decreases the criticality by 12.44% along with reducing the resources by 12.23%.
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