Abstract:Recently FPGA researchers have proposed different approaches to enable dynamic voltage scaling (DVS) for FPGAs. While the proposed approaches have shown that DVS is able to significantly reduce FPGA power consumption, most of these solutions were developed only for the soft fabric of the FPGA and hence cannot be deployed for applications that use the FPGA hard blocks such as block RAMs (BRAMs). In this work, we extend a previously proposed offline calibration-based DVS approach to enable DVS for FPGAs with BRAMs; we build testing circuitry to ensure that all used BRAM cells operate safely while scaling $V_{dd}$, and we develop testing procedures that are able to measure the delay of timing paths that start or end at BRAMs. We extend the CAD tool FRoC to automatically generate calibration designs with BRAM testers along with soft fabric testers to measure the actual $F_{max}$ of each application on any chip under different operating conditions; this information is stored in a calibration table that is then used when the application is running to scale $V_{dd}$ to the minimum value that guarantees safe operation at the desired speed. Using our proposed solution, we show that we can run a discrete Fourier transform core with 32% and 46% power reduction compared to the conventional fixed-voltage operation at the reported $F_{max}$ and at a lower clock frequency, respectively.

An Automated Test Framework for SRAM-based FPGA

An Easily Reconfigurable Simulation Environment on FPGA Based Platform

A design-for-test for SRAM-based FPGA interconnect testing

A novel layout automation flow to facilitate test chip design for standard cell characterization

An Effective Test Method for Block RAMs in Heterogeneous FPGAs Based on a Novel Partial Bitstream Relocation Technique

Modeling And Testing The Interconnect Resources Of Sram-Based Fpgas

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

A Standalone FPGA-test Platform with Bi-directional Ports Supported

A Novel Method for FPGA Test Based on Partial Reconfiguration and Sorting Algorithm (Abstract Only).

Design for HW/SW Co-Testing Based on FPGA

A novel configurable boundary-scan circuit design of SRAM-based FPGA

A novel FPGA manufacture-oriented interconnect fault test

Design and Implementation of Flexible Embedded SRAM Compiler

A Run-Time Built-in Approach of TID Test in SRAM Based FPGAs

A Deep Research on the Chip Verification Platform Based on Network

A flexible embedded SRAM compiler

A novel configuration system for FPGA test based on algorithm and ping-pong operation

A Novel Test Methodology For Design Of An Embedded Synchronous Dual-Read/Write Port Sram With Configurable Capacity

BIST Approach for Testing Configurable Logic and Memory Resources in FPGAs.

An integrated and automated memory optimization flow for FPGA behavioral synthesis

Automatic BRAM Testing for Robust Dynamic Voltage Scaling for FPGAs