Abstract:This article deals with the design of on-chip architectures for testing large system chips (SOCs) for manufacturing defects in a modular fashion. These architectures consist of wrappers and test access mechanisms (TAMs). For an SOC with specified parameters of modules and their tests, we design an architecture that minimizes the required tester vector memory depth and test application time. In this article, we formulate the test architecture design problems for both modules with fixed- and flexible-length scan chains, assuming the relevant module parameters and a maximal SOC TAM width are given. Subsequently, we derive a formulation for an architecture-independent lower bound for the SOC test time. We analyze three types of TAM under-utilization that make the theoretical lower bound unachievable in most practical architecture instances. We present a novel architecture-independent heuristic algorithm that effectively optimizes the test architecture for a given SOC. The algorithm efficiently determines the number of TAMs and their widths, the assignment of modules to TAMs, and the wrapper design per module. We show how this algorithm can be used for optimizing both test bus and TestRail architectures with either serial or parallel test schedules. Experimental results for the ITC'02 SOC Test Benchmarks show that, compared to manual best-effort engineering approaches, we can save up to 75% in test times, while compared to previously published algorithms, we obtain comparable or better test times at negligible compute time.

SOC Design and Test

A Test Architecture for Test Reuse in SOC Design

Challenges for Progress in Test and Design for Testability

An Overview of Design Methodology and Design for Testability for SOC's

Design of the Power Management Module Integrated in SOC

System Design, Simulation and Implementation with CoCentric

Accelerating RTL Quality Assessment Method Based on CAD Tools

SOC Testing Methodology and Practice

Design for Testability for System-on-Chip

SOC Testing Based on Reuse

To Discuss the BIST in SOC Test

A JTAG Standard-based Test Circuit Design for SOC System

System Level Design of SOC

A SOC Test Circuit Design and Implement Based on JTAG

Design and implementation of a PCB testing system

Introduction to the Special Issue on Design for Testability and Reliability of Security-aware Hardware

Embedded SOC System Design

Hierarchical Timing-driven Layout Based on .25um Technology

A Microprocessor Based SOC Built-In Test Scheme

SOC test architecture design for efficient utilization of test bandwidth

Research and Progress of Low Power Design in SOC Era