A Study of Electrical Characteristics for Boron Implantation of Mbe Grown Hgcdte

GS Huang,RB Ji,WZ Fang,JR Yang,XQ Chen,L He
DOI: https://doi.org/10.3321/j.issn:1001-9014.1999.01.003
1999-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:The electrical property of boron implantation of MBE grown HgCdTe and the profile of carrier concentration and mobility measured by sheet Hall were presented. After etching the epilayer to p-n junction position, the transmittance of this position was raised, which was ascribed to the high transmission of junction region.
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