Study on electric properties of boron ion implantation of MBE grown HgCdTe

Gensheng Huang,Rongbin Ji,Weizheng Fang,Jianrong Yang,Xinqiang Chen,Li He
1999-01-01
Abstract:The electric properties of boron ion implantation of MBE (molecular beam epitaxy) grown HgCdTe and the profile of carrier concentration and mobility measured by sheet Hall method were presented. After etching the epilayer to p-n junction position, the transmittance of this position was raised, which was ascribed to the high transmission of junction region. The width of junction region was also given.
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