Lateral Algan/Gan Power Diode With Mis-Gated Hybrid Anode For Ultra-Low Turn-On Voltage And High Breakdown Voltage

Qi Zhou,Kai Hu,Yi Yang,Qian Cheng,Dong Wei,Changxu Dong,Wanjun Chen,Bo Zhang
DOI: https://doi.org/10.1109/ifws.2017.8246001
2017-01-01
Abstract:In this letter, a novel AlGaN/GaN lateral power diode featuring a recessed Metal/Al2O3/III-Nitride (MIS) Gated-hybrid-anode (MG-HAD) was experimentally demonstrated. The unique Gated-hybrid-anode design and accordingly the new current conduction mechanism enable the MG-HAD to deliver ultra-low forward turn-on voltage (V-T) and reverse leakage for lowering the power consumption of the device. The typically ultra-low turn-on voltage of 0.3 V is obtained in the MG-HAD improved by 67 % compared with the fabricated-conventional AlGaN/GaN SBDs. Moreover, the ultra-low V-T exhibits good uniformity with the minimum and maximum V-T of 0.2 and 0.55 V, respectively. To the best of our knowledge, 0.2 V is the lowest V-T of GaN power diodes up to date. On the other hand, a high breakdown voltage of over 1.1 kV at respectably low leakage current of 1 mu A/mm was obtained in the proposed MG-HAD with anode-to-cathode spacing (LAC) of 20 mu m. Besides the superior device performance, the proposed diode is fully-compatible with normally-off AlGaN/GaN MISFETs, which establish a basis for high-speed and high-efficiency full-GaN single-chip power ICs.
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