High-Voltage Algan/Gan-Based Lateral Schottky Barrier Diodes

Kang He,Wang Quan,Xiao Hong-Ling,Wang Cui-Mei,Jiang Li-Juan,Feng Chun,Chen Hong,Yin Hai-Bo,Wang Xiao-Liang,Wang Zhan-Guo,Hou Xun
DOI: https://doi.org/10.1088/0256-307x/31/6/068502
2014-01-01
Chinese Physics Letters
Abstract:Lateral Schottky barrier diodes (SBDs) on AlGaN/GaN heterojunctions are fabricated and studied. The characteristics of the fabricated SBDs with different Schottky contact diameters and different Schottky-Ohmic contact spacings are investigated. The breakdown voltage can be increased by either increasing the Schottky-Ohmic contact spacing or increasing the Schottky contact diameter. However, the specific on-resistance is increased at the same time. A high breakdown voltage of 1400 V and low reverse leakage current below 20nA are achieved by the device with a Schottky contact diameter of 100 μm and a contact spacing of 40 μm, yielding a high V2BR/RON,sp value of 194 MW.cm−2.
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