Electronic and Optical Properties of Energetic Particle-Irradiated In-rich InGaN

University of California, Berkeley,Yu K. M.,Wu J.,Walukiewicz W.,Ager J. W.,Shan W.,Lu Hai,Schaff William J.,Kemp W.
DOI: https://doi.org/10.1557/proc-864-e7.10
2005-01-01
Abstract:We have carried out a systematic study of the effects of irradiation on the electronic and optical properties of InGaN alloys over the entire composition range. High energy electrons, protons, and 4 He + were used to produce displacement damage doses ( D d ) spanning over five orders of magnitude. The free electron concentrations in InN and In-rich InGaN increase with D d and finally saturate after a sufficiently high D d . The saturation of carrier density is attributed to the formation of native donors and the Fermi level pinning at the Fermi Stabilization Energy ( E FS ), as predicted by the amphoteric native defect model. Electrochemical capacitance-voltage (ECV) measurements reveal a surface electron accumulation whose concentration is determined by pinning at E FS .
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