Native Defects in InxGa1−xN Alloys

SX Li,KM Yu,J Wu,RE Jones,W Walukiewicz,JW Ager,W Shan,EE Haller,H Lu,WJ Schaff
DOI: https://doi.org/10.1016/j.physb.2005.12.111
2006-01-01
Abstract:To elucidate the role of native defects in determining the electronic and optical properties of In1−xGaxN, energetic particle irradiation (electrons, protons, and 4He+) has been used to intentionally introduce point defects into InxGa1−xN alloys. Optical absorption, Hall effect, and capacitance–voltage (CV) measurements are used to evaluate properties of these materials. Irradiation produces donor-like defects in InxGa1−xN with x>0.34, while acceptor-like defects form in Ga-rich InxGa1−xN (x<0.34). A sufficiently high irradiation dose pins the Fermi level at the Fermi level stabilization energy (EFS), as predicted by the amphoteric defect model. Pinning of the Fermi level at this energy is also responsible for the surface electron accumulation effect in unirradiated In-rich In1−xGaxN.
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