Temperature Dependence of Raman Scattering in AlInN

L. F. Jiang,J. F. Kong,W. Z. Shen,Q. X. Guo
DOI: https://doi.org/10.1063/1.3594697
IF: 2.877
2011-01-01
Journal of Applied Physics
Abstract:A detailed investigation of temperature-dependent micro-Raman scattering has been carried out on AlInN films with different Al compositions (0–0.53). The observed phonon frequency downshift and linewidth broadening with increasing temperature can be well explained by a model taking into account the contributions of the thermal expansion, the lattice-mismatch-induced strain, and the anharmonic phonon processes. It is found that with increasing Al composition the three-phonon process increases over the four-phonon process, but still is not the obvious prevailing process in the phonon decay of AlInN. We have attributed it to the variation of structural properties and phonon density of states in AlInN.
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