Effects of indium composition x and temperature on the raman phonon properties of InxGa1-x N alloys with high Indium composition

李烨操,胡海楠,刘斌,张荣,滕龙,庄喆,谢自力,陈敦军,郑有炓
DOI: https://doi.org/10.3969/j.issn.2095-2783.2013.07.022
2013-01-01
Abstract:InGaN thin films have been grown on the GaN/α-Al2O3(0001) template by metal-organic chemical vapor deposition(MOCVD).The diffraction peaks of InGaN(0002) and GaN(0002) are observed in the X-ray diffraction(XRD) spectra,which reveals the single crystalline c-orientation wurtzite structure of InGaN alloys.Besides,the In composition x of these samples is calculated to be from 0.34 to 1 by using measured Bragg diffraction angles.These InGaN alloys were first studied by Raman scattering at room temperature.It is found that the peak position of both A1(LO) and E2(high) phonons shifts to low energies with the increase of composition x,which obeys the single-mode behavior.The results of Raman scattering spectra under varied temperatures(93-673 K) show that the Raman shift of A1(LO) phonon decreases non-linearly with elevated temperatures,which could be attributed to the temperature dependence of crystal thermal expiation and the lattice vibration anharmonicity.
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