Large-area solar-blind AlGaN-based MSM photodetectors with ultra-low dark current

Feng Xie,Hai Lu,D. J. Chen,Ping Han,Rong Zhang,Youdou Zheng,Liang Li,Wenhai Jiang,Chen Chen
DOI: https://doi.org/10.1049/el.2011.1695
2011-01-01
Electronics Letters
Abstract:Large-area metal-semiconductor-metal (MSM) solar-blind photodetectors with a device area of 5×5mm2 have been fabricated on Al 0.4Ga0.6N/AlN/sapphire epistructure. The photodetector exhibits ultra-low dark current density of 3.2×10-12A/cm 2 under 20V bias and a corresponding breakdown voltage of up to 385V. The solar-blind/ultraviolet rejection ratio of the photodetector is more than four orders of magnitude with a maximum quantum efficiency of 28 at 275nm. © 2011 The Institution of Engineering and Technology.
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