Fabrication of porous silicon insulation layer with infrared focal plane and its application

范茂彦,姜胜林,张丽芳
DOI: https://doi.org/10.13245/j.hust.2011.11.011
2011-01-01
Abstract:Porous silicon samples were prepared by electrochemical method and primary batteries method,and the porous silicon(PS) pore size,porosity and film thickness were controlled by different HF concentrations,current densities and reaction times in the anodic oxidation reaction.It was found that the porosity values of PS samples prepared by different current density had the same trend that the porosity increased at the beginning and then decreased with etching time.The growth rate of PS is increased with current density.BST pyroelectric sensor was encapsulated on the surface of the porous silicon sample.The sample test results show that the thermal insulation properties of porous silicon is close to micro-bridge.
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