Reflectivity of porous-pyramids structured silicon surface

Junfeng Xiao,Lei Wang,Xiaoqiang Li,Xiaodong Pi,Deren Yang
DOI: https://doi.org/10.1016/j.apsusc.2010.07.014
IF: 6.7
2010-01-01
Applied Surface Science
Abstract:The antireflection of porous-pyramids structured silicon surface has been studied. The porous surface is formed by stain etching in HF/Fe(NO3)3 aqueous solution after textured in KOH/IPA solution. Reflectivity measurements show an overall reflectance of 4.2% for porous-pyramids textured silicon surface in the range from 400 to 900nm. An optimal etching time of 30min is obtained when both reflectivity and photo-generated carriers lifetime are considered. This technique may be probably used in the texturization process for high-efficiency silicon solar cells.
What problem does this paper attempt to address?