Design of A Gate-Coupled Electrostatic Discharge Protection Structure

Wang Yuan,Jia Song,Sun Lei,Zhang Gang-Gang,Zhang Xing,Ji Li-Jiu
DOI: https://doi.org/10.7498/aps.56.7242
IF: 0.906
2007-01-01
Acta Physica Sinica
Abstract:A novel gate-coupled electrostatic discharge (ESD) protection structure, called bonding-pad capacitance gate-coupled device, is designed. The new structure solves the problem of the traditional gcMOS device not being able to give correct transient response to some specific ESD events. The device layout area is also reduced. The measured results show that the novel structure has a 26%-41% layout area reduction and a high ESD robustnesss greater than 8 kV in a standard 0.5 mu m single poly triple metal complementary metal-oxide-semiconductor process.
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