Study on the Growth of Pure and Ga3+ Doped γ-LiAlO2 Crystals

PENG Guan-liang,Zhuang Yi,ZOU Jun,WANG Yin-zhen,LIU Shi-liang,ZHOU Guo-qing,ZHOU Sheng-ming,XU Jun,GAN Fu-xi
DOI: https://doi.org/10.3969/j.issn.1000-985X.2005.03.004
2005-01-01
Abstract:γ-LiAlO2 single crystals are anticipated to act as a promising substrate material for the epitaxy of GaN because of the little lattice misfit (about 1.4%) with GaN. Firstly, large-size γ-LiAlO2 single crystal with dimension of φ 45 × 50 mm3 has been grown by Czochralski technique. Then Ga2O3 was used as a dopant. The doping concentrations of trivalent gallium varied from 10% to 30% (in the melt) with respect to the substituted site. Ga3+-doped γ-LiAlO2 crystals were grown also by Czochralski technique. The components of LiAl1-xGaxO2 (x = 0, 0.1, 0.2, 0.3) as-grown crystals and residual melt in the crucibles were characterized using X-ray powder diffraction (XRPD) analysis, respectively. The result shows that LiAl1-xGaxO2 (x = 0, 0.1, 0.2, 0.3) crystals should be assigned to γ-LiAlO2 crystallization structure, and in which Al3+ ions were partly substituted by Ga3+ ions. Segregation of trivalent gallium was occurred and its segregation coefficient is smaller than 1.
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