Growth studies of m -GaN layers on LiAlO 2 by MOCVD

Zou Jun,Liu Cheng-Xiang,Zhou Sheng-Ming,Wang Jun,Zhou Jian-Hua,Huang Tao-Hua,Han Ping,Xie Zi-Li,Zhang Rong,邹军,刘成祥,周圣明,王军,周建华,黄涛华,韩平,谢自力,张荣
DOI: https://doi.org/10.1088/1009-1963/15/11/040
2006-01-01
Chinese Physics
Abstract:This paper reports that the m-plane GaN layer is grown on (200)-plane LiAlO2 substrate by metal-organic chemical vapour deposition (MOCVD) method. Tetragonal-shaped crystallites appear at the smooth surface. Raman measurement illuminates the compressive stress in the layer which is released with increasing the layer's thickness. The high transmittance (80%), sharp band edge and excitonic absorption peak show that the GaN layer has good optical quality. The donor acceptor pair emission peak located at similar to 3.41 eV with full-width at half maximum of 120 meV and no yellow peaks in the photoluminescence spectra partially show that no Li incorporated into GaN layer from the LiAlO2 substrate.
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