Ion beam synthesis of C-N crystalline film and its analysis

Shude Yao,Shouyuan Chen,Jun Ma,YaWei Zhang,Weijing Feng,Xuemei Wang,Mingfang Wu,ChaoQun Tang
1998-01-01
Abstract:The carbon nitride crystalline thin film formed by N+ implantation into the carbon film deposited on the Si(100) substrate is reported. The implanted film was characterized by Rutherford backscattering spectrometry (RBS) and X-ray diffraction (XRD). The RBS result shows the film containing about 70% of C and 30% of N. The XRD spectrum indicates the existence of C-N crystalline phase in the film.
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