X-ray diffraction analysis on the RF-CVD deposited carbon nitride films

D.W. Wu,W. Fan,H.X. Guo,M.B. He,X.Q. Meng,X.J. Fan
DOI: https://doi.org/10.1016/S0038-1098(97)00158-0
IF: 1.934
1997-01-01
Solid State Communications
Abstract:The X-ray diffraction (XRD) spectra of carbon nitride films deposited on Si and alloy steel substrates have been studied. The experimental results indicate that beta-C3N4 crystal film is relatively easy to be deposited on the Si wafer with a Si3N4 buffer layer and post-treatment at 800 degrees C helps the films to crystallize. These beta-C3N4 crystals bear a specific orientation relationship with the direction of Si wafer. Seven diffraction peaks for beta-C3N4 and six ones for alpha-C3N4 have been observed for C-N film on the alloy steel substrate. These XRD results match the theoretical calculated lattice constants of beta-C3N4 and alpha-C3N4 pattern. (C) 1997 Elsevier Science Ltd.
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