Structures and bonding properties of carbon nitride films prepared by radio frequency magnetron sputtering

Jiandong Guo,Yin'an Li,RuWen Zhao,Enge Wang
1999-01-01
Abstract:Carbon nitride films were deposited on Si(100) single-crystalline wafers by reactive radio frequency magnetron sputtering. The structures, compositions, and chemical bonding states of the obtained films were investigated systematically. X-ray diffraction suggested the prepared films had amorphous structures. Infrared transmittance spectra indicated the carbon and nitrogen atoms incorporated with chemical bonds, including CN single bonds. Multiple beam interference (MBI) was observed in the infrared spectra, which was proved by scanning electron microscope analyses. The refraction indices of the films were about 1.9 based on the calculation of MBI. X-ray photoelectron spectra reinforced the suggestion that there existed single bonds between carbon and nitrogen atoms, and also showed the atomic ratio of N to C was approximately 0.45.
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