Investigations on Structural Properties of Carbon Nitride Films Synthesized by Reactive Ionized Cluster Beam Deposition

JQ Xie,Y Zheng,JY Feng
DOI: https://doi.org/10.1016/s0168-583x(96)00776-8
1996-01-01
Abstract:Carbon nitride thin films have been prepared by reactive ionized cluster beam (RICB) technique, using low molecular weight polyethylene as evaporation material and NH3, N2 as reactive gas. Rutherford backscattering measurements show that the composition ratio, N C , as high as 0.67, can be obtained. Transmission electron microscopy investigations suggest that the films contain the crystalline β-C3N4 phase. Infrared absorption measurements indicate that chemical bonds are formed between carbon and nitrogen atoms. The results also show that the structure of the films varied mainly with the RICB parameters: ionization current and acceleration voltage.
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