Structure and tribological properties of carbon nitride films obtained by the reactive ionized cluster beam method

J.Y Feng,J.Q Xie,X.R Zou,H.W Lu
DOI: https://doi.org/10.1016/S0257-8972(02)00391-2
IF: 4.865
2002-01-01
Surface and Coatings Technology
Abstract:Carbon nitride thin films were synthesized by the reactive ionized cluster beam (RICB) deposition. Raman scattering analysis shows the existence of a characteristic peak due to covalent CN single bonds. This is consistent with the results of Fourier transform infrared (FTIR) transmission measurements. Rutherford backscattering (RBS) measurements show that the composition ratio, N/C, as high as 0.67, can be obtained. The films deposited under the optimized experimental conditions exhibit an extremely high hardness of 61 GPa. The friction and wear behavior of these films without any lubrication were measured by a reciprocating-motion ball-on-disk tribometer. It is noted that the deposited films have low initial and a steady-state friction coefficients less than 0.08. The wear factor of carbon nitride films is significantly lower than that of carbon thin films prepared by the same deposition system and evaluated under similar test conditions. These results are very encouraging for the tribological applications of carbon nitride films.
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