Structure, mechanical and tribological properties of carbon nitride thin films

Jun Qi,Jianbin Luo,Shizhu Wen
2000-01-01
Abstract:Amorphous carbon nitride thin films were prepared by reactive radio frequency magnetron sputtering method. The effect of negative substrate bias voltage on the hardness and elasticity of the films was studied by use of nanohardometer. The structure of the carbon nitride films was characterized by X-ray photoelectron spectrometer. Furthermore, in the fretting test, the influence of vibration frequency, displacement amplitude and normal load on the friction coefficient of the carbon nitride thin films was studied.
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