Surface and interface study of U/Si (1 1 1)

Qiuyun Chen,Wei Feng,Xiegang Zhu,Lizhu Luo,Donghua Xie,Shiyong Tan,Xinchun Lai
DOI: https://doi.org/10.1016/j.apsusc.2013.10.037
IF: 6.7
2014-01-01
Applied Surface Science
Abstract:•The surface morphology of U/Si (111) with different annealing temperature is given.•A new phase of USi1.67 was found when annealing the sample at 870K.•A new superstructure is found for U–Si system.•Electronic structure of U–Si system is studied by UPS.
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