Growth and Characterization of InGaN Nanodots Hybrid with InGaN/GaN Quantum Wells

G. F. Yang,P. Chen,Z. G. Yu,B. Liu,Z. L. Xie,X. Q. Xiu,Z. L. Wu,F. Xu,Z. Xu,X. M. Hua,P. Han,Y. Shi,R. Zhang,Y. D. Zheng
DOI: https://doi.org/10.1007/s00339-012-7112-2
2012-01-01
Applied Physics A
Abstract:Uniform InGaN nanodots were successfully grown on SiO 2 pretreated GaN surface. It was found that the InGaN nanodots were 20 nm in diameter and 5 nm in height, approximately. After the growth of two periods of InGaN/GaN quantum wells on the surface of InGaN nanodots, nanodot structure still formed in the InGaN well layer caused by the enhanced phase separation phenomenon. Dual-color emissions with different behavior were observed from photoluminescence (PL) spectrum of InGaN nanodots hybrid with InGaN/GaN quantum wells. A significant blueshift and a linewidth broadening were measured for the low-energy peak as the increase of PL excitation power, while a slight blueshift and a linewidth narrowing occurred for the high-energy peak. Accordingly, these two peaks were assigned to be from the In-rich nanodots and quantized state transition from the InGaN/GaN quantum wells with indium content, respectively.
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