Raman Spectra As A Measure of Interface Alloying for Iv/Iv Superlattices

J Zi,KM Zhang,XD Xie
DOI: https://doi.org/10.1116/1.589421
1997-01-01
Abstract:Raman spectra of strained (001)-oriented Si/Ge and α-Sn/Ge superlattices with alloyed interfaces are calculated by a bond-polarizability model with lattice dynamical properties described by using a Keating model. The alloyed interface layers are treated by using a supercell technique. It is found that the Raman peaks around 410 cm−1 of Si/Ge superlattices and 260 cm−1 of α-Sn/Ge superlattices could be used as a measure of interface alloying.
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