Characteristics of I(A-Si-H)/N+(Mc-Si-H) Junctions and Electron-Transport in P-Doped Mc-Si-H Films

BJ YAN,JY LIU,XH GENG,LF SHI,ZL SUN,WY XU
DOI: https://doi.org/10.1002/pssa.2211250214
1991-01-01
Abstract:The transport properties of the electrons in i(a-Si:H)/n+ (mc-Si:H) junctions are investigated by I-U measurements and sweep-out experiments. It is shown that the tunnel and recombination process of the electrons in the junction dominates the transport properties of the layer devices. The tunnelling and recombining current is effectively prevented by entering an undoped mc-Si:H or a P-doped a-Si:H buffer layer which not only separates the electrons in n+-mc-Si:H layer and dangling bonds defects in the undoped a-Si:H layer but also decreases the interface states in the junction. A diode with better properties of i(a-Si:H)/n+ (mc-Si:H) junction is obtained by setting a buffer layer, and the layered sample with structure i1(a-Si:H)/n+ (mc-Si:H)/i2(a-Si:H) is also made for performing the sweep-out experiments to probe the transport of electrons in the high level P-doped mc-Si:H films. The experimental results show that the electron mobility is about 0.2 cm2/Vs and the electron density is in the order of 10(20) cm-3 for the mc-Si:H at a doping level of PH3/SiH4 = 0.16%.
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