Development of High Temperature Lateral HV and LV JFETs in 4H-SiC

Y. Zhang,Kuang Sheng,Ming Su,Jian H. Zhao,Petre Alexandrov,Leonid Fursin
DOI: https://doi.org/10.4028/www.scientific.net/MSF.600-603.1091
2009-01-01
Materials Science Forum
Abstract:A series of high voltage (HV) and low voltage (LV) lateral JFETs are successfully developed in 4H-SiC based on the vertical channel LJFET (VC-LJFET) device platform. Both room temperature and 300 degrees C characterizations are presented. The HV JFET shows a specific-on resistance of 12.8 m Omega.cm(2) and is capable of conducting current larger than 3 A at room temperature. A threshold voltage drop of about 0.5V for HV and LV JFETs is observed when temperature varies from room temperature to 300 degrees C. The measured increase of specific-on resistance with temperature due to a reduction of electron mobility agrees with the numerical prediction. The first demonstration of SiC power integrated circuits (PIC) is also reported, which shows 5 MHz switching at V-DS of 200 V and on-state current of 0.4 A.
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