Electron Microscopy Characterization of High Yield Growth of Thin TiO2 Nanowires

H Li,J Jiao
DOI: https://doi.org/10.1017/s1431927608081555
IF: 4.0991
2008-01-01
Microscopy and Microanalysis
Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
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