Transmission Electron Microscopy of Metal Nanodendrites Grown on Insulator Substrates by Electron-Beam-Induced Deposition

G Xie,M Song,K Mitsuishi,K Furuya

DOI: https://doi.org/10.1017/s1431927605505075

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

What problem does this paper attempt to address?

A Nanowire Produced by Electron Beam-Induced Deposition and Its Electric Properties

M Shimojo,M Takeguchi,R C Che,W Zhang,K Furuya

DOI: https://doi.org/10.1017/s1431927605500126

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Chuanhong Jin,Kazu Suenaga,Sumio Iijima

DOI: https://doi.org/10.1017/s1431927609092691

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

Z Shan,E A Stach,J M K Wiezorek,D M Follstaedt,J A Knapp,S X Mao

DOI: https://doi.org/10.1017/s1431927605510432

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

Kazu Suenaga,Yuta Sato,Zheng Liu,Masanori Koshino,Chuanhong Jin

2012-01-01

Abstract:Here we show how a high-resolution transmission electron microscopy can be applied to characterize the carbon nanostructures. Direct imaging of the hexagonal network of carbon nanotube enables us to determine the chiral index and to visualize the topological defects, such as pentagons and heptagons. Individual molecular imaging has also become possible, and atomic structure of fullerene molecules (C-60 and C-80) has been successfully identified at a single-molecular basis. Some recent progress for in situ observation of the carbon nanotube/fullerene growth and the defect dynamics is also presented.
TEM and Optical Studies of Ni/NiO Nanoparticles in Ni-ion-implanted Al2O3

X T Zu,S Zhu,X Xiang,L Wang

DOI: https://doi.org/10.1017/s1431927605500217

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Characterization of Nanometer-Sized Pt-dendrite Structures Fabricated on Insulator Al 2 O 3 Substrate by Electron-Beam-induced Deposition

Guoqiang Xie,Minghui Song,Kazutaka Mitsuishi,Kazuo Furuya

DOI: https://doi.org/10.1007/s10853-006-7769-z

IF: 4.5

2006-01-01

Journal of Materials Science

Abstract:Nanometer-sized Pt-dendrite structures were fabricated on an insulator Al2O3 substrate using an electron-beam-induced deposition (EBID) process in a transmission electron microscope (TEM). The as-fabricated structures were characterized using conventional and high-resolution transmission electron microscopies (CTEM and HRTEM) and X-ray energy dispersive spectroscopy (EDS). The as-fabricated nanodendrites consisted of many nano-grains and amorphous state structures. The nanometer-sized grains were determined to be Pt crystals with face-centered cubic (fcc) structure. The formation of the nanodendrite structures are discussed to relate to a mechanism involving charge-up produced on surface of the substrate, movement of charges to and accumulation at the convex surface of the substrate and the tips of the deposits.
Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator SiO/sub 2/ Substrate with Electron-Beam-induced Deposition in HVTEM

Guoqiang Xie,Minghui Song,K. Mitsuishi,K. Furuya

DOI: https://doi.org/10.1109/imnc.2004.245764

2004-01-01

Abstract:Electron-beam-induced deposition is one of the most promising techniques to fabricate small-sized structures on substrates. An advantage of this process is that the deposited position can be controlled due to controllability of electron beam.
TEM and Magnetic Studies of Metallic Nanoparticles in Ni-ion-implanted Rutile

Xiao Tao Zu,Shi-Liang Zhu,X. Xiang,L. M. Wang

DOI: https://doi.org/10.1017/s1431927605500205

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator Sio2 Substrate by Electron-Beam-Induced Deposition under Hvtem

GQ Xie,MH Song,K Mitsuishi,K Furuya

DOI: https://doi.org/10.1143/jjap.44.5654

IF: 1.5

2005-01-01

Japanese Journal of Applied Physics

Abstract:Self-standing W-nanodendrite structures were fabricated on an insulator SiO2 substrate by electron-beam-induced deposition under a 1000kV high-voltage transmission electron microscope (HVTEM). The growth process and as-fabricated structures were characterized by conventional and high-resolution transmission electron microscopies (CTEM and HRTEM) and X-ray energy dispersive spectroscopy (EDS). The nucleation and growth of nanodendrite structures are attributed to a mechanism involving charge-up produced on the substrate surface, and the movement of charges to and charge accumulation at the convex surface of the substrate as well as the tips of the deposits. The as-fabricated nanodendrite structures possess a high crystallinity and a high content of tungsten. The structures consist of many nanometer-scale body-centered cubic (bcc) W crystals.
Electron Annealing in Aluminum Interconnects Observed Using in Situ TEM Technique

D. Xie,M. Li,Z. Shan

DOI: https://doi.org/10.1017/s1431927613004509

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Growth of Tungsten Nanodendrites on SiO2 Substrate Using Electron-Beam-induced Deposition.

GQ Xie,MH Song,K Mitsuishi,K Furuya

DOI: https://doi.org/10.1166/jnn.2005.075

2005-01-01

Journal of Nanoscience and Nanotechnology

Abstract:Tungsten nanodendrite structures were fabricated on an insulator SiO2 substrate using an electron-beam-induced deposition process in a high voltage transmission electron microscope. The effect of electron beam accelerating voltage on the nanodendrite structures was investigated. The morphologies and their growth rates did not have obvious difference for the deposition at accelerating voltages from 400 to 1000 kV. A mechanism for the growth and morphology of the nanodendrite structure was proposed involving charge-up produced on the surface of the substrate, movement of charges to and accumulation at the convex surface of the substrate and the tips of the deposits. High-energy electron irradiation enhanced diffusion of W atoms in the nanodendrites, promoted crystallization of W grains, so that more crystallized W nanodendrite structures were achieved by the electron-beam-induced deposition process using higher energy electron beams.
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Electron Beam Introduced Metallic Nanowires Growth

Zhichao Chen,Zhan Yang,Tao Chen,Lining Sun,Toshio Fukuda,Lijun Yang,Li Xiangpeng,Guanxin Chi

DOI: https://doi.org/10.1109/nano.2016.7751343

2016-01-01

Abstract:This paper presented a method of growing metallic nanowires by using electron beam technology under scanning electron microscopy (SEM). The metallic nanoparticles were dispersed evenly on Indium-Tin Oxide (ITO) by the spin coater. The ITO sample was experimentally prepared by the spin coating technique. The electron beam was focused on a metallic nano particle inside SEM, which were dispersed on the ITO. The growth of metallic nanowires was controlled by the movement of the electron beam. The method this paper presented can be employed for different kinds of metallic and can be used to fabricate metallic nanowires with different length.
Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

J Zhu,R Yu,ZY Cheng,T Ling,N Lu,L Xie,ZD Cheng,HH Zhou,XY Zhong

DOI: https://doi.org/10.1017/s1431927610059131

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Recent Electron Microscopy Results on Micro- and Nanostructured Ni-Ti-(X) Shape Memory Alloys

D. Schryvers,Wim Tirry,Zhiqing Yang,Shanshan Cao,He Tian,Rémi Delville

2009-01-01

Abstract:The present contribution will focus on recent advanced transmission electron microscopy studies of Ni-Ti based alloys with the emphasis on features related to the martensitic transformation. The examples range from the atomic scale when looking at the atomic structure of a precipitate to the micron scale when looking at the configuration of these precipitates or to twin configurations in particular ternary alloys. An example of the first is the refinement of the atomic structure of a Ni4Ti3 precipitate formed in Ni-rich Ni-Ti alloys to enhance the shape memory behaviour. A slice-and-view study to obtain the 3D configuration of these precipitates is an example of the latter. Some other examples will be discussed as well.
In-situ Heating Electron Microscopy on Cu/SnO2 Bilayer Nanoribbons

X F Zhang,M Law,R Yu,T KuyKendall,P Yang

DOI: https://doi.org/10.1017/s1431927605504537

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extract HTML view is not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button. Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Electron Microscopy Characterization of High Yield Growth of Thin TiO2 Nanowires

H Li,J Jiao

DOI: https://doi.org/10.1017/s1431927608081555

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM

TS Zheleva,SJ Kilpatrick,MH Ervin,X Li,A Cao,PM Ajayan

DOI: https://doi.org/10.1017/s1431927606067262

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Transmission Electron Microscopy of Metal Nanodendrites Grown on Insulator Substrates by Electron-Beam-Induced Deposition

A Nanowire Produced by Electron Beam-Induced Deposition and Its Electric Properties

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

High-Resolution Transmission Electron Microscopy Imaging Of Carbon Nanostructures

TEM and Optical Studies of Ni/NiO Nanoparticles in Ni-ion-implanted Al2O3

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Characterization of Nanometer-Sized Pt-dendrite Structures Fabricated on Insulator Al 2 O 3 Substrate by Electron-Beam-induced Deposition

Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator SiO/sub 2/ Substrate with Electron-Beam-induced Deposition in HVTEM

TEM and Magnetic Studies of Metallic Nanoparticles in Ni-ion-implanted Rutile

Fabrication and Characterization of Self-Standing W-Nanodendrites on Insulator Sio2 Substrate by Electron-Beam-Induced Deposition under Hvtem

Electron Annealing in Aluminum Interconnects Observed Using in Situ TEM Technique

Growth of Tungsten Nanodendrites on SiO2 Substrate Using Electron-Beam-induced Deposition.

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

Electron Beam Introduced Metallic Nanowires Growth

Determination of Atomic Structures of Crystal Defects, Interfaces and Surfaces Via Aberration-Corrected Transmission Electron Microscopy

Recent Electron Microscopy Results on Micro- and Nanostructured Ni-Ti-(X) Shape Memory Alloys

In-situ Heating Electron Microscopy on Cu/SnO2 Bilayer Nanoribbons

Electron Microscopy Characterization of High Yield Growth of Thin TiO2 Nanowires

Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM