Abstract:In this work we report on lead zirconate titanate (PZT) ferroelectric nanestructures fabricated by dip-coating process on silicon substrates covered by nano-porous alumina membranes with pore sizes of 20 nm-100 nm served as templates. Microstructures of the PZT ferroelectric nanostructures were examined by scanning transmission electron microscopy (STEM) with both planar and cross-sectional samples. Cross-sectional TEM images, in conjunction with energy dispersive X-ray elemental analyses revealed the presence of isolated ferroelectric nanastructures imposed by the membrane interiors. Lateral dimensions of the PZT nanostructures can be controlled by the nano-pore sizes of the used alumina membranes. The nano-pores of the alumina membranes were fully penetrated by PZT solution via dip-coating technique, and their interiors were conformally coated by the PZT material with a coating thickness of 4nm-15nm. That was confirmed by the observed lines with dark TEM contrast within the nano-pores. PZT material exists in the manner of continuous medium and/or discrete grains in the channels of nano-pores. Planar STEM images demonstrated that the PZT nanostructures had an oval shape morphology, which was caused by either a local deformation of the nano-pores or shrinkage of PZT solution during the post-annealing process. The ordered FZT nanestructures with a conformal coating thickness of 4 nm-15nm fabricated on Si substrates by dip-coating process, have promising applications in the future, non-volatile ferroelectric random access memories with 3-dimensional structures.

Electric-Induced Deposition of Lead Zirconate Titanate Porous Monolayer Film

Preparation of PZT Thick Film by a High Speed Sol-gel Method

Interface and Surface Characterization of Lead Zirconate Titanate Thin Films Grown by Sol–Gel Method

Limits of Formation of Random Grown Perovskite and Pyrochlore Phases in Sol–gel Derived La Modified Lead Zirconate Titanate Thin Films

THE PROCESSING EFFECTS ON STRUCTURE AND PROPERTIES OF SOL-GEL DERIVED PLZT FERROELECTRIC THIN FILMS

Growth and Characterization of Lead Zirconate Titanate (PZT) Thin Films

Electrohydrodynamic Deposition of Nanostructured Lead Zirconate Titanate.

Sol-Gel Process and Properties of Textured Pb(Zr, Ti)O-3 Films on Silicon Wafers

The Microstructure and Ferroelectric Properties of PbZr0.52Ti0.48O3 Films on Mica Substrates

Percolative Nanoparticle-Ag/pbzr0.52ti0.48o3 Composite Thin Film with High Dielectric and Ferroelectric Properties

Growth Mode of Sol-Gel Derived PLT Seeding Layers on Glass Substrates and Its Effect on Templating the Oriented Growth of PLZT Thin Films

Preparation and characterization of Sol-Gel derived PZT bulk ceramics and thin films

Preparation and properties of PLZT thick films on silicon

Ferroelectric Nanostructures Fabricated by Dip-Coating Process and Microstructural Characterization by Scanning Transmission Electron Microscopy

Preparation and Characterization of Sol–gel Derived (100)-Textured Pb(Zr,Ti)O3 Thin Films: PbO Seeding Role in the Formation of Preferential Orientation

Thickness-dependent structural characteristics of sol–gel-derived epitaxial (PbZr)TiO3 films using inorganic zirconium salt

The post crystallization process of lead zirconate titanate films and effects on dielectric properties

Epitaxial Plt Thin Films Prepared by A Sol-Gel Process

Magnetoelectric Cofe2o4-Lead Zirconate Titanate Thick Films Prepared By A Polyvinylpyrrolidone-Assisted Sol-Gel Method

Effect of LaNiO3 interlayer on electrical properties of Pb(Zr0.52Ti0.48)O3/LaNiO3/Pb(Zr0.52Ti0.48)O3 composite films

Fabrication And Characterization Of Zinc Oxide Films With Ordered Two-Dimensional Pore Arrays