From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

OL Warren,SA S Asif,AM Minor,Z Shan,EA Stach

DOI: https://doi.org/10.1017/s1431927606062726

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

What problem does this paper attempt to address?

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Zhi-Wei Shan,Andrew M. Minor,S. A. Syed Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927606064488

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

Z. W. Shan,J. Oh,A. M. Minor,S. A. S. Asif,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609098584

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Developments in in Situ Nanomechanical Testing

JD Nowak,RC Major,J Oh,Z Shan,S Asif,OL Warren

DOI: https://doi.org/10.1017/s1431927610062598

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
In Situ Nanoindentation Mechanical Property of Films by Atomic Force Microscope

Du Yuanming,Zhang Yuefei,Zhang Changhui,Liu Yanping

2015-01-01

Rare Metal Materials and Engineering

Abstract:An in situ nanoindentation test system was established by combining atomic force microscope (AFM) and scan electron microscope (SEM). This system enabled the indentation experiment using the AFM cantilever with Cube corner diamond indenter, and acquired the curve of load versus displacement. The experimental process can be observed in real time by in situ SEM simultaneously. A mechanical property testing method, based on the AFM cantilever loading curve and the in situ SEM indentation of images analysis, was well developed. The hardness and elastic model of the plastic thin film were obtained by measuring the maximum loading during the indentation and the residual area of the indentation by measuring SEM image. This method was demonstrated by conducting the indentation experiment on the sliver film deposited on the Si substrate using magnetron sputtering. Furthermore, the experiment conducted by the Nanoindenter G200 was presented here for comparison. The results show that the in situ AFM indentation possesses higher resolution of loading and displacement, and can achieve the indentation experiment scaled from nN to mN of the applied load. The hardness of the plastic thin film can be obtained by measuring the residual area of indentation. The pile-up effect of the soft film deposited on the hard substrate, which exists in the Oliver-pharr method, can be reduced by SEM image analyses of residual area and the calculation has a higher testing accuracy and reliability as well.
In situ nanoindentation in the TEM

Oden L. Warren,Zhiwei Shan,S.A. Syed Asif,Eric A. Stach,J.W. Morris,Andrew M. Minor

DOI: https://doi.org/10.1016/S1369-7021(07)70051-2

IF: 24.2

2007-01-01

Materials Today

Abstract:The past decade has witnessed remarkable advances in in situ transmission electron microscopy (TEM) techniques(1). We describe the progress that has been made in coupling TEM to nanoindentation for direct observation of material mechanics at the microstructural Level(2).
Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Zhi-Wei Shan,Andrew M. Minor,SA S Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927608085474

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Probing the Mechanical Properties of Nanostructures in the TEM

A. M. Minor,J. Ye,C. Chisholm,R. K. Mishra,Z. W. Shan,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609096901

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
A New Perspective on Mechanical Testing: in Situ Compression in the TEM

Julia Deneen Nowak,Zhiwei Shan,Oden L Warren

DOI: https://doi.org/10.1017/s1551929500059769

2008-01-01

Microscopy Today

Abstract:Testing the mechanical properties of nanoscale materials faces a number of inherent challenges. As the size of the “target” decreases, the inability to actually see what occurs during testing can be troublesome. While a number of studies have attempted to characterize the mechanical response of nanoscale materials using traditional nanoindentation techniques, certain lingering questions have always remained. For example, the nature and sequence of failure events in the case of multilayer films has long been the subject of scientific debate. Similarly, in the case of individual nanoparticles, it is often difficult to ascertain that contact was both made and maintained throughout the test. Further, the crystallographic orientation of the sample and/or the presence of preexisting defects, which can have a significant influence on mechanical properties at the nanoscale, typically remain unknown.
Indentation-Enabled in Situ Mechanical Characterization of Micro/Nanopillars in Electron Microscopes

Qiang Guo,Xidan Fu,Xiaolei Guo,Zhiying Liu,Yan Shi,Di Zhang

DOI: https://doi.org/10.1007/s11837-018-2751-1

2018-01-01

JOM

Abstract:Indentation-enabled micro/nanomechanical characterization of small-scale specimens provides powerful new tools for probing materials properties that were once unattainable by conventional experimental methods. Recent advancement in instrumentation further allows mechanical testing to be carried out in situ in electron microscopes, with high spatial and temporal resolution. This review discusses the recent development of nanoindentation-enabled in situ mechanical testing in electron microscopes, with an emphasis on the study of micro/nanopillars. Focus is given to novel applications beyond simple compressive and tensile testing that have been developed in the past few years, and limitations and possible future research directions in this field are proposed and discussed.
Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

BG Demczyk,Wang Ym,John Cumings,M Hetman,Wei-Qiang Han,A. Zettl,R.O. Ritchie

DOI: https://doi.org/10.1017/s1431927606062933

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Plasticity live: Direct observation nanomechanical testing in the TEM

Zhiwei Shan,Andrew M. Minor,S. A. Syed Asif,Oden L. Warren

2008-01-01

Abstract:The transmission electron microscope (TEM) is usually used as a tool to investigate the microstructures of materials after deformation or to reveal the dynamic evolution of materials upon the application of stress when equipped with a qualitative deformation holder. Scanning probe microscopes equipped with a force-displacement transducer are known to provide quantitative mechanical data regarding material deformation. The fundamental mechanical mechanism of materials deformation is usually inferred from the above data. However, the absence of a one-to-one relationship between the microstructure and the mechanical curve makes the inferred mechanism at best a reasonable speculation. By incorporating the advantages of these two kinds of instruments, we have recently developed a novel and unique in situ TEM device, named PicoIndenter, which provides an unprecedented ability to accurately measure the force vs. displacement relationship during the deformation of individual nanostructures while simultaneously live-monitoring the microstructure evolution. This presentation will report the current progress in applying our unique in situ TEM device (transducer specifications are 0.4nm RMS noise floor and 5000nm maximum for displacement and 0.1 mu N RMS noise floor and 1000 mu N maximum for load) to mechanical measurement of sub-micron Al grains, nanoparticles, nanowires, and sub-micron pillars. The underlying physical mechanisms that account for the observed novel experimental phenomena will be discussed.
In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

Z Shan,E A Stach,J M K Wiezorek,D M Follstaedt,J A Knapp,S X Mao

DOI: https://doi.org/10.1017/s1431927605510432

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

B. Barton,R. Buonsanti,A. Dong,D. Milliron,C.F. Kisielowski,L.P. Hansen,S. Helveg,B. Jiang

DOI: https://doi.org/10.1017/s1431927612009889

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
A NEW PERSPECTIVE ON NANO-MECHNICS: QUANTITATIVE DEFORMATION TEST IN THE TEM

Z. W. Shan,A. M. Minor,O. L. Warren

2009-01-01

Abstract:It is often a challenge to measure accurately the mechanical properties of nanostructures and nanomaterials on account of their extremely small physical dimensions. Recently, Hysitron have developed an in situ TEM nanomechanical testing apparatus which enables one to acquire quantitative mechanical data while simultaneously recording the microstructure evolution of the materials during deformation, developing a one-to-one relationship between imposed stress and individual deformation event. In this paper, we reviewed our recent progress in the application of this in situ TEM device for measuring the mechanical behavior of individual single crystal nickel pillars and nanocrystalline cadmium sulphide (CdS) hollow spheres. Prior to the deformation tests, nickel pillars fabricated with Focused Ion Beam (FIB) were observed to contain a high density of defects. However, quite unexpectedly, the dislocation density was observed to decrease dramatically during the deformation process and, in some cases, even resulted in a dislocation-free crystal. The phenomena, which we termed as "mechanical annealing", are direct confirmation of dislocation starvation mechanism and sheds new light on the unusual mechanical properties associated with submicron- and nano- scale structures. The compression tests on nanocrystalline CdS hollow spheres revealed that as prepared structure can withstand theoretical level high stress while at the same time enables the spherical shells to be compressed up to 20% of the outer diameter of the spheres prior to fracture. These findings shed new lights on the potential applications of nanostructured materials.
Incipient Plasticity in Thin Films: an In-Situ TEM Indentation Study

J De Hosson,W Soer,A Minor,Z Shan,SA Syed Asif,OL Warren

DOI: https://doi.org/10.1017/s1431927606061095

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
In Situ Nano-Indentation of a Gold Sub-Micrometric Particle Imaged by Multi-Wavelength Bragg Coherent X-ray Diffraction

Florian Lauraux,Stéphane Labat,Marie-Ingrid Richard,Steven J Leake,Tao Zhou,Oleg Kovalenko,Eugen Rabkin,Tobias U Schülli,Olivier Thomas,Thomas W Cornelius

DOI: https://doi.org/10.3390/ma15186195

2022-09-06

Abstract:The microstructure of a sub-micrometric gold crystal during nanoindentation is visualized by in situ multi-wavelength Bragg coherent X-ray diffraction imaging. The gold crystal is indented using a custom-built atomic force microscope. A band of deformation attributed to a shear band oriented along the (221) lattice plane is nucleated at the lower left corner of the crystal and propagates towards the crystal center with increasing applied mechanical load. After complete unloading, an almost strain-free and defect-free crystal is left behind, demonstrating a pseudo-elastic behavior that can only be studied by in situ imaging while it is invisible to ex situ examinations. The recovery is probably associated with reversible dislocations nucleation/annihilation at the side surface of the particle and at the particle-substrate interface, a behavior that has been predicted by atomistic simulations. The full recovery of the particle upon unloading sheds new light on extraordinary mechanical properties of metal nanoparticles obtained by solid-state dewetting.
In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

Q. Yu,A. Minor,L. Qi,J. Li,R. Mishra

DOI: https://doi.org/10.1017/s1431927612005545

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In Situ and Quantitative Tensile Study of Deformation Twinning in Submicron-Sized Mg Crystals Inside a Transmission Electron Microscope

B Liu,Z Shan,X Zhang,J Sun,E Ma

DOI: https://doi.org/10.1017/s1431927611003084

IF: 4.0991

2011-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.
In-situ Transmission Kikuchi Diffraction Nano-tensile Testing

Tijmen Vermeij,Amit Sharma,Douglas Steinbach,Jun Lou,Johann Michler,Xavier Maeder

2024-10-29

Abstract:We present a novel methodology for in-situ Transmission Kikuchi Diffraction (TKD) nano-tensile testing that enables nanoscale characterization of the evolution of complex plasticity mechanisms. By integrating a modified in-situ Scanning Electron Microscope (SEM) nanoindenter with a microscale push-to-pull device and a conventional Electron Backscatter Diffraction (EBSD) detector, we achieved TKD measurements at high spatial resolution during mechanical deformation. A dedicated Focused Ion Beam (FIB) procedure was developed for site-specific specimen fabrication, including lift-out, thinning, and shaping into a dog-bone geometry. The methodology was demonstrated on two case studies: (i) a metastable $\beta$-Ti single crystal, on which we quantified the initiation and evolution of nanoscale twinning and stress-induced martensitic transformation, and (ii) a $CuAl/Al_2O_3$ nanolaminate, which showed nanoscale plasticity and twinning/detwinning in a complex microstructure. Overall, this approach provides a robust alternative to in-situ EBSD and Transmission Electron Microscopy (TEM) testing, facilitating detailed analysis of deformation mechanisms at the nanoscale.

Materials Science,Instrumentation and Detectors

From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

Developments in in Situ Nanomechanical Testing

In Situ Nanoindentation Mechanical Property of Films by Atomic Force Microscope

In situ nanoindentation in the TEM

Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Probing the Mechanical Properties of Nanostructures in the TEM

A New Perspective on Mechanical Testing: in Situ Compression in the TEM

Indentation-Enabled in Situ Mechanical Characterization of Micro/Nanopillars in Electron Microscopes

Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

Plasticity live: Direct observation nanomechanical testing in the TEM

In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

The Challenge of Imaging Hard/soft Matter Interfaces at Atomic Resolution

A NEW PERSPECTIVE ON NANO-MECHNICS: QUANTITATIVE DEFORMATION TEST IN THE TEM

Incipient Plasticity in Thin Films: an In-Situ TEM Indentation Study

In Situ Nano-Indentation of a Gold Sub-Micrometric Particle Imaged by Multi-Wavelength Bragg Coherent X-ray Diffraction

In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

In Situ and Quantitative Tensile Study of Deformation Twinning in Submicron-Sized Mg Crystals Inside a Transmission Electron Microscope

In-situ Transmission Kikuchi Diffraction Nano-tensile Testing