Probing the Mechanical Properties of Nanostructures in the TEM

A. M. Minor,J. Ye,C. Chisholm,R. K. Mishra,Z. W. Shan,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609096901

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

What problem does this paper attempt to address?

Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

Zhi-Wei Shan,Andrew M. Minor,SA S Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927608085474

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

L-M Peng,Q Chen,JY Wang,MS Wang,ZY Zhang,CH Jin,XL Wei

DOI: https://doi.org/10.1017/s1431927606069510

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Zhi-Wei Shan,Andrew M. Minor,S. A. Syed Asif,Oden L. Warren

DOI: https://doi.org/10.1017/s1431927606064488

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

Z. W. Shan,J. Oh,A. M. Minor,S. A. S. Asif,O. L. Warren

DOI: https://doi.org/10.1017/s1431927609098584

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

Chuanhong Jin,Kazu Suenaga,Sumio Iijima

DOI: https://doi.org/10.1017/s1431927609092691

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

K. Suenaga,Y. Sato,Z. Liu,M. Koshino,C. Jin

DOI: https://doi.org/10.1017/s1431927609092460

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Quantitatively Probing the Mechanical Behavior of Submicron-sized Metal Pillars in the TEM

ZW Shan

DOI: https://doi.org/10.1017/s1431927610054449

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

JM Zuo,T Kim,Q Chen,LM Peng,EA Olson

DOI: https://doi.org/10.1017/s1431927608082445

IF: 4.0991

2008-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

BG Demczyk,Wang Ym,John Cumings,M Hetman,Wei-Qiang Han,A. Zettl,R.O. Ritchie

DOI: https://doi.org/10.1017/s1431927606062933

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM

TS Zheleva,SJ Kilpatrick,MH Ervin,X Li,A Cao,PM Ajayan

DOI: https://doi.org/10.1017/s1431927606067262

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
Developments in in Situ Nanomechanical Testing

JD Nowak,RC Major,J Oh,Z Shan,S Asif,OL Warren

DOI: https://doi.org/10.1017/s1431927610062598

IF: 4.0991

2010-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.
Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

S Lazar,L-Y Chang,L Gunawan,Y Shao,GA Botton

DOI: https://doi.org/10.1017/S1431927609098663

IF: 4.0991

2009-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009
Plasticity live: Direct observation nanomechanical testing in the TEM

Zhiwei Shan,Andrew M. Minor,S. A. Syed Asif,Oden L. Warren

2008-01-01

Abstract:The transmission electron microscope (TEM) is usually used as a tool to investigate the microstructures of materials after deformation or to reveal the dynamic evolution of materials upon the application of stress when equipped with a qualitative deformation holder. Scanning probe microscopes equipped with a force-displacement transducer are known to provide quantitative mechanical data regarding material deformation. The fundamental mechanical mechanism of materials deformation is usually inferred from the above data. However, the absence of a one-to-one relationship between the microstructure and the mechanical curve makes the inferred mechanism at best a reasonable speculation. By incorporating the advantages of these two kinds of instruments, we have recently developed a novel and unique in situ TEM device, named PicoIndenter, which provides an unprecedented ability to accurately measure the force vs. displacement relationship during the deformation of individual nanostructures while simultaneously live-monitoring the microstructure evolution. This presentation will report the current progress in applying our unique in situ TEM device (transducer specifications are 0.4nm RMS noise floor and 5000nm maximum for displacement and 0.1 mu N RMS noise floor and 1000 mu N maximum for load) to mechanical measurement of sub-micron Al grains, nanoparticles, nanowires, and sub-micron pillars. The underlying physical mechanisms that account for the observed novel experimental phenomena will be discussed.
Measurements of Functional Response of Nano-objects Using Advanced Electron Microscopy

Y Zhu,T Beetz,L Wu,R Klie,L Huang,JW Lau,MA Schofield,VV Volkov,M Beleggia,M Malac

DOI: https://doi.org/10.1017/s143192760606925x

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005
From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

OL Warren,SA S Asif,AM Minor,Z Shan,EA Stach

DOI: https://doi.org/10.1017/s1431927606062726

IF: 4.0991

2006-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006
In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

Q. Yu,A. Minor,L. Qi,J. Li,R. Mishra

DOI: https://doi.org/10.1017/s1431927612005545

IF: 4.0991

2012-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

Z Shan,E A Stach,J M K Wiezorek,D M Follstaedt,J A Knapp,S X Mao

DOI: https://doi.org/10.1017/s1431927605510432

IF: 4.0991

2005-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005
Recent Findings on the Mechanical Responses of Nanostructures to Extreme Loading Conditions

Zhen Chen,Yong Gan,Luming Shen,J. K. Chen

DOI: https://doi.org/10.1063/1.3452310

2010-01-01

Abstract:A systematic investigation is being performed to understand the combined size, loading rate and thermal effects on the responses of nanostructures such as nanofilms and nanowires. This paper summarizes what has been found so far, and presents the recent molecular dynamics simulations of the mechanical behaviors of single crystal fcc nanowires and nanofilms under different temperatures and extremely high strain rates. Based on the model‐based simulation results, the mechanism of the nanostructural responses will be explored and future research tasks will be discussed.
Probing the Mechanical Properties of Individual Single-Walled Carbon Nanotubes

Yang Wu,Feng Wang,Mingyuan Huang,X. M. Henry Huang,Limin Huang,Hugen Yan,Stephen O’Brien,James Hone,Tony F. Heinz

DOI: https://doi.org/10.1364/ls.2006.ltul2

2006-01-01

Abstract:Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text Y. Wu, F. Wang, M. Huang, X. M. Henry Huang, L. Huang, H. Yan, S. O’Brien, J. Hone, and T. F. Heinz, "Probing the Mechanical Properties of Individual Single-Walled Carbon Nanotubes," in Frontiers in Optics, OSA Technical Digest (CD) (Optica Publishing Group, 2006), paper LTuL2. Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys

H. Xing,K. Kim,J.M. Zuo,M.A. Hemphill,G.Y. Wang,C.W. Tsai,J.W. Yeh,K.A. Dahmen,P.K. Liaw

DOI: https://doi.org/10.1017/s143192761300559x

IF: 4.0991

2013-01-01

Microscopy and Microanalysis

Abstract:Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Probing the Mechanical Properties of Nanostructures in the TEM

Exploring the Mechanical Properties of Nanostructures and Nanomaterials inside a TEM

In-situ Fabrication, Manipulation and Property Measurements of Single Nanotubes and Nanowires with Near Atomic Resolution

Measuring the Mechanical Behavior of Individual Nanoparticles Inside a TEM

Quantitative Tem Tensile Testing on 1d Nano-Structural Materials

In-Situ HR-TEM Characterizations on Individual Carbon Nanotubes During Its Manipulation, Deformation and Growth

HR-TEM of Carbon Network, Towards Individual C-C Bond Imaging

Quantitatively Probing the Mechanical Behavior of Submicron-sized Metal Pillars in the TEM

Electron Microscopy of Nanodevices: in Situ and Ex Situ Characterization of Structure and Transport Properties of Carbon Nanotubes

Direct Mechanical Measurement of the Tensile Strength and Elastic Modulus of Multiwalled Carbon Nanotubes

Carbon Nanotube - Substrate Interface Characteristics Studied Via TEM

Developments in in Situ Nanomechanical Testing

Applications of Aberration-corrected TEM and STEM in Complex Oxides and Nanostructured Materials

Plasticity live: Direct observation nanomechanical testing in the TEM

Measurements of Functional Response of Nano-objects Using Advanced Electron Microscopy

From Hardness Testing Relying on Optical Imaging to Quantitative In-Situ Nanoindentation in a Transmission Electron Microscope

In Situ TEM Tensile Tests of Nanoscale Mg Samples Oriented for Basal Slip

In-Situ TEM Studies of the Deformation Mechanism of Nanocrystaline Ni

Recent Findings on the Mechanical Responses of Nanostructures to Extreme Loading Conditions

Probing the Mechanical Properties of Individual Single-Walled Carbon Nanotubes

Scanning Nano Beam Electron Diffraction and Applications to Characterization of High Entropy Alloys