Quantitatively Exploring the Mechanical Behavior of Si Nanowires Inside a TEM
ZW Shan,LL Cao,D Gao,AM Minor,SA S Asif,OL Warren
DOI: https://doi.org/10.1017/s1431927607077525
IF: 4.0991
2007-01-01
Microscopy and Microanalysis
Abstract:Journal Article Quantitatively Exploring the Mechanical Behavior of Si Nanowires inside a TEM Get access ZW Shan, ZW Shan Hysitron Incorporated Search for other works by this author on: Oxford Academic Google Scholar LL Cao, LL Cao University of Pittsburgh Search for other works by this author on: Oxford Academic Google Scholar D Gao, D Gao University of Pittsburgh Search for other works by this author on: Oxford Academic Google Scholar AM Minor, AM Minor Lawrence Berkeley National Laboratory Search for other works by this author on: Oxford Academic Google Scholar SA S Asif, SA S Asif Hysitron Incorporated Search for other works by this author on: Oxford Academic Google Scholar OL Warren OL Warren Hysitron Incorporated Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 13, Issue S02, 1 August 2007, Pages 74–75, https://doi.org/10.1017/S1431927607077525 Published: 05 August 2007