In situ nanoindentation in the TEM

Oden L. Warren,Zhiwei Shan,S.A. Syed Asif,Eric A. Stach,J.W. Morris,Andrew M. Minor
DOI: https://doi.org/10.1016/S1369-7021(07)70051-2
IF: 24.2
2007-01-01
Materials Today
Abstract:The past decade has witnessed remarkable advances in in situ transmission electron microscopy (TEM) techniques(1). We describe the progress that has been made in coupling TEM to nanoindentation for direct observation of material mechanics at the microstructural Level(2).
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