Abstract:Due to the atomic thickness and planar characteristics, two-dimensional (2D) materials such as graphene and transition metal dichalcogenides (TMDs) are considered to be excellent electronic materials, which endow them with great potential for future device applications. The robust and reliable application of their functional devices requires an in-depth understanding of their mechanical properties and deformation behavior, which is also of fundamental importance in nanomechanics. Considering their exceedingly small sizes and thicknesses, this is a very challenge task. In situ microscopy techniques show great superiority in this respect. This review focuses on the progress in in situ microscopy techniques (including atomic force microscopy (AFM), scanning electron microscopy (SEM), and transmission electron microscopy (TEM)) in characterizing the mechanical properties and deformation behavior of 2D materials. The technical characteristics, advantages, disadvantages, and main research fields of various in situ AFM, SEM, and TEM techniques are analyzed in detail, and the corresponding mechanical scenarios from point to plane are realized, including local indentation, planar stretching, friction sliding between atomic layers and atomic movement mechanisms. By virtue of their complementary advantages, in situ integrated microscopy techniques enable the simultaneous study of various mechanical properties, nanomechanical behavior, and inherent atomic mechanisms of 2D materials. Based on the present research, we look forward to further optimized in situ integrated microscopy techniques with high spatiotemporal atomic resolution that can reveal the dynamic structure-performance correlations and corresponding atomic mechanisms between the physical properties, such as mechanical, electrical, optical, thermal, and magnetic properties of 2D materials and their crystal structures, electronic structures, atomic layers, defect densities and other influencing factors under multifield coupling conditions. This will provide beneficial predictions and guidance for the design, construction and application of 2D material-based mechanoelectronic, piezoelectric, photoelectric, thermoelectric, etc. nanoelectronic devices.

<i>In situ</i> characterization of the mechanical properties of nanoparticles and nanoscale structures

Atomistic perspective on in situ nanomechanics

Mechanical Characterization Device For In Situ Measurement Of Nanomechanical Properties Of Micro/Nanostructures

In Situ Nanomechanical Testing of Twinned Metals in a Transmission Electron Microscope

In Situ Tem Nanomechanics

In Situ Nanoindentation Mechanical Property of Films by Atomic Force Microscope

Video Enhanced Depth-Sensing Indentation Technique for Characterizing Mechanical Behaviour of Biomaterials

EXPERIMENTAL NANOMECHANICS OF ONE-DIMENSIONAL NANOMATERIALS BY IN SITU MICROSCOPY

OS5-2-3 an In-Situ Micro-Tension Setup and Its Application

Recent Advances on in Situ SEM Mechanical and Electrical Characterization of Low-Dimensional Nanomaterials.

In situ nanomechanical measurement of Cu nanowires

Advances on in Situ TEM Mechanical Testing Techniques: a Retrospective and Perspective View

In situ TEM probing properties of individual one-dimensional nanostructures

Note: Nanomechanical characterization of soft materials using a micro-machined nanoforce transducer with an FIB-made pyramidal tip

Mechanical Properties of 2D Materials Studied by in Situ Microscopy Techniques

Nanomechanical Characterization of Metallic Materials

B11-O-10In Situ Atomic Scale Mechanical Microscopy

In situ microscopy techniques for characterizing the mechanical properties and deformation behavior of two-dimensional (2D) materials

An integrated push-to-pull micromechanical device: Design, fabrication, and in-situ experiment

An In-Situ, Micro-Mechanical Setup with Accurate, Tri-Axial, Piezoelectric Force Sensing and Positioning

Nanoindentation and Mechanical Properties of Materials at Submicro- and Nanoscale Levels: Recent Results and Achievements